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Chemical Microscope - List of Manufacturers, Suppliers, Companies and Products

Chemical Microscope Product List

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ALS Electrochemical Analyzer Model 920D Series SECM

Approach to Surface Analysis

The Model 920D Series Scanning Electro-Chemical Microscope (SECM) is a device for observing chemical changes near interfaces with high resolution.

  • Analytical Equipment and Devices
  • Scanning Probe Microscope
  • Other physicochemical equipment

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Scanning electrochemical microscope from the German company Sensolytics.

The scanning electrochemical microscope from the German company SENSOLYTICS is low-cost and high-performance.

- The base SECM configuration uses a high-quality stepping motor-controlled XYZ positioning system, with a scan range of 25x25x25 mm and a resolution of 20 nm. - Option High-Res: An option to improve resolution, with a scan range of 100x100x100 μm and a resolution of 3 nm using a piezoelectric positioning system. - Option Shear-Force: For rough samples (uneven surfaces), a sophisticated feedback mechanism maintains a constant distance between the tip and the sample while scanning.

  • Other microscopes

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Tohoku University Technology: High Frequency-Enhanced ESM: T19-796

Enabling to evaluate low-conductivity material

Electrochemical strain microscopy (ESM) is known as a technique for probing ion mobility, ion conductivity, etc. in a solid material at a nanoscale. The ESM method is a method for detecting a signal of a local volume change (electrochemical distortion) of a solid generated with the movement of ions by applying a voltage, and for imaging and outputting the detected signal.  The ESM method provides an image showing the distribution of ion motion states, but the sharpness of the image depends on the ionic conductivity of the solid material. Therefore, in a solid material having a relatively low ionic conductivity, sufficient S/N ratio cannot be obtained, and it is difficult to evaluate the motion state of ions with high accuracy.  The present invention has been made in view of the above circumstances, and by applying a high-frequency bias voltage, it is possible to dramatically enhance a response signal generated in accordance with a motion state of ions. According to the present invention, even in a material having a relatively low ionic conductivity, a distribution image can be obtained with sufficient sharpness.

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